摘要
应用激光线结构光传感器 ,将视觉检测成功应用于栅状阵列器件的共面性测量中 ,建立了测量系统数学模型 ,提出了以三点法为基础的共面性评价方法 ,并对BGA芯片进行了相应的试验研究 ,取得了满意的结果。
Adopting line-structured laser sensor, successfully applies the visual inspection to the grid array device coplanarity measurement. With the mathematics model put forward, the evaluating method based on the three-point seating plane is presented, and corresponding experimental studies on the BGA chip coplanarity are carried out, which achieve satisfactory results.
出处
《机械工程学报》
EI
CAS
CSCD
北大核心
2001年第5期78-80,89,共4页
Journal of Mechanical Engineering
基金
国家自然科学基金资助项目! (6 990 6 0 0 1)
