一种改进的VLSI关键面积计算模型和方法

An Improved Model and Method of Calculating the VLSI Critical Area

从故障机理上研究了现有的关键面积计算模型 ,改进了其开路 /短路关键面积计算模型的故障核 ,从而得到适用于一般版图图形结构的关键面积计算方法 .这对计算 VL SI关键面积、指导版图优化设计和提高 IC成品率有重要意义 .

Fault mechanism of available critical area model is studied.An improved fault-kernel of open/short defect is presen- ted, which is suitable for the critical area calculation of general VLSI layout structure.It is important to the calculation of VLSI critical area and the optimization of IC layout design.