组合电路伪穷举测试的一种生成算法

An Algorithm for Pseudo-Exhaustive Test Generation for Combinational Circuits

提出一种基于电路结构的伪穷举测试生成算法,通过对待测电路的逐步二块划分和对各个子电路的穷举测试,形成待测电路的伪穷举测试集.本算法从实际应用出发,基于电路结构进行选优划分,算法简单,运行速度快.通过这一算法,伪穷举测试能够实现机器自动生成,并充分发挥了伪穷举测试的各项优点,因此具有一定的实用价值.

Pseudo-exhaustive testing is a promising approach for test generation for combinational circuits.This paper proposes an algorithm for pseudo-exhaustive test generation.The algorithm does binary partitioning recur-sively on the circuit to be tested and combines the exhaustive test sets of all the sub-circuits to generate the pseudo-exhaustive test set for the original circuit.It is an application-oriented ad hoc algorithm.It works based on the circuit structure to produce optimal or nearly optimal circuit partitioning and is simple to implement.A machine program implementing the algorithm works satisfactorily and runs fast.The proposed algorithm makes machine generation of pseudo-exhaustive test possible and it is applicable for practical uses.