电子探针图像的非等间距采样技术

Technique of Nonuniformly Sampling Images on an Electron Probe

本文基于二维采样定理 ,提出两种非等间距采集电子探针 X射线像方法。对于颗粒形状比较规则 ,X射线信号变化有明显区域特征的样品 ,实行分区等间距采样 ;对于颗粒形状不规则 ,X射线信号变化无明显区域特征的样品 ,实行自适应改变间距采样。应用这两种非等间距采样方法 ,能够在保证图像质量的前提下 ,通过减少不必要的采样点数 ,节省采样时间 13%～19%。

Based on the two dimensional sampling law,two methods of nonuniformly sampling x- ray images on an electron probe are proposed.One is sampling at the equal interval in each subdivision for those specimens which are in regular shape and x- ray signals have obvious regional characteristics.The other is sampling ata self- adap- tively adjusting interval for those specimens which are not in regular shape and x- ray signals have no obvious re- gional characteristics.By the methods reducing unnecessary sampling points,the mapping progress of electron probe can speed up 13%— 19% under certain qualities.