双缝衍射用于CCD响应特性标定的模拟研究

Simulation Research for Double-Slit Diffraction Application to CCD Response Features Scaling

输入输出响应特性是 CCD应用中的一项重要参数 ,标定这一参数的方法很多。介绍一种新的标定方法——双缝衍射法 ,即利用双缝衍射图像各亮条纹的衰减关系来产生不同的 CCD能量输入 ,从而标定 CCD的响应。给出了模拟结果。

Input/output response feature is an important parameter in CCD application. There are a lot of methods for scaling this parameter. A new scaling method--double-slit diffraction method is introduced in the paper. That is to say, the different CCD energy inputs are produced by means of attenuating relation among various bright fringes in double-slit diffraction image, so that the CCD response can be scaled. The simulation results are also given.