摘要
引线框架电镀层的质量直接影响着钽电容器的可焊性 ,所以引线框架电镀层质量的测定方法至关重要。通过对比试验认为对框架切片后使用电子探针仪探测和拍照的测定方法能够全面准确地测定出引线框架镀层的质量。
The Quality of lead frame plating layer directly affects the solderability of tantalum capacitor, so its measuring methods are very important. The comparison experiments showed that the quality of the plating layer can be measured exactly by detecting and taking picture of the lead frame cutting sample
出处
《电子产品可靠性与环境试验》
2001年第4期31-33,共3页
Electronic Product Reliability and Environmental Testing
关键词
引线框架
电镀层
测试方法
钽电容器
tantalum capacitor
lead frame
plating layer
measuring ways