摘要
提出了一种通过谱线权重来正确识别X射线能谱重叠峰的新方法。应用该方法 ,成功地分析了Ti合金微区中能量差为 2 0eV的Ti和V的重叠峰。实验表明 ,该方法简便、可靠 ,并可适用于K
In this paper the present author develops a new method of the identification of X RAY energy specimen overlap peaks by comparing weighs of lines (I Kβ /I Kα ) and the method has been successfully applied to identify the EDS overlap peaks with the energy difference 20eV of Ti and V in samples of Ti alloy. The results show that this is a simple and effective method and can be suitable for analysis of elements among K Zn.
出处
《理化检验（物理分册）》
CAS
2001年第5期195-197,共3页
Physical Testing and Chemical Analysis(Part A:Physical Testing)
