Cd_(1-x)Zn_xTe(x=0.04)表面处理的低温拉曼散射和电学特性研究

LOW-TEMPERATURE RAMAN SCATTERING SPECTRA AND ELECTRICAL PROPERTIES OF Cd_(1-x) Zn_xTe(x=0.04) OF DIFFERENT SURFACE TREATMENTS

测量了几种不同处理的 Cd1 - x Znx Te(x=0 .0 4)表面的傅里叶变换拉曼散射光谱和电流 -电压 (I- V)特性 .通过分析拉曼光谱反 Stokes分量 ,并与表面 I- V特性进行比较 ,结果表明与表面处理相联系的晶格声子的行为反映了表面完整性的变化 ,Te沉淀是影响表面质量的关键因素 ,并对有关表面处理方法的实际应用进行了讨论 .

Fourier transform Raman scattering spectra and current-voltage (I-V) features were measured for Cd1-x ZnxTe(x = 0.04) surfaces of different treatments. By analyzing the anti-stokes Raman spectra and comparing with surface current-voltage (I-V) curves, it was concluded that the behavior of the lattice phonons which are associated with surface treatments reflects the perfection-variation of Cd1-xZnxTe(x = 0.04) surface. It was also found that Te precipitates on Cd1-xZnxTe(x = 0.04) surface are crucial to surface quality. In addition, potential application of the different surface treatments was discussed.