AlX谱线电子碰撞展宽的理论研究

Theoretical calculations of electron impact broadening of Al X lines

使用 R-矩阵方法和半经验方法 ,计算了高价离子 Al X2 s2 1S-2 s2 p1P0 共振谱线在电子密度为 1 0 17cm-3 时的线宽和线移随温度的变化关系 ,两种计算得到的线宽结果符合得比较好。使用半经验方法可以获得大量谱线的电子碰撞展宽 ,以满足需要大量数据的等离子体不透明度的计算的需要。

The width and shift of the Al X resonance line 2s21S-2s2p1P0 were calculated by using R-matrix method and semi-empirical method. Good agreement was found between the two calculations. The semi-empirical method can easily obtain large numbers of widths and therefore can be applied to derive the opacity of plasmas by using detailed-term-accounting-approximation calculations. Some other widths of Al X lines were also obtained by using the semi-empirical method. Detailed-term-accounting model can obtain accurate opacities of high temperature plasmas, but it requires large numbers of atomic parameters such as excitation energies, oscillator strengths and widths of dipole allowed transitions. The results presented show that the calculations of the electron impact broadening can be greatly simplified by using semi-empirical method.