摘要
在现代电子系统的设计过程中 ,由于对系统的可靠性和可维护性要求越来越高 ,因此必须针对具体情况设计相应的内建自检 (built-inself-testing,BIST)模块 ,从而保证系统能够进行准确的故障检测和故障定位与隔离。提出了一种基于两维压缩特征字分析的BIST方法 ,就其压缩原理和检测性能进行了详细分析。分析结果表明 ,通过时域和空域的两维压缩 ,可以用较短的特征字实现高故障覆盖率。该方法简单可靠 ,便于硬件实现。
The designing process of modern electronic systems demands high system reliability and maintainability. In order to perform fault detection, localization and isolation effectively, it is necessary to design a BIST (built-in self-testing) module specific for the system. This paper presents a BIST method based on 2-dimensional-compressed signature analysis. The principle of compression and performance of test are discussed in detail. With a short signature compressed 2-dimentionally both in time domain and space domain, this method can achieve a high faulty coverage ratio. Theoretical analysis shows that this method is reliable and easy to be implemented in hardware.
出处
《系统工程与电子技术》
EI
CSCD
北大核心
2001年第9期1-4,共4页
Systems Engineering and Electronics
