用同步光微束作激发源的PSS性能研究

Study on PSS performances using synchrotron radiation light as an exciting source

用同步光微束作激发源 ,对所研制的平面晶体波长色散位置灵敏谱仪 (PSS)性能进行了研究。结果表明 ,用LiF(2 0 0 )晶体测得TiKα的能量分辨率达 14 .2eV ,比Si(Li)探测器的能量分辨率好一个多量级 ;用Si(Li)观察不锈钢样品中的CrKβ与MnKα两X线为一重叠的峰 ,而用PSS能清楚地分辨它们 ;对K2 Cr2 O7样品中Cr的探测限 <2 0 0 μg/ g和对一气溶胶样品中Ti的可检测量达 10 - 9— 10 - 10 g量级。结果表明 ,随着实验条件的改善使PSS的探测限进一步降低 ,在同步光束线上用PSS开展高能量分辨的微量元素分析将是可行的。

A study on the performances of wavelength-dispersive position sensitive spectrometer with a flat crystal (PSS) using micro-synchrotron radiation light beam (μ-SRL) as exciting source was made. The energy resolution of 14.2eV for Ti Kα, which was one order of magnitude better than that measured by Si(Li) detector, was obtained. The overlap between Cr Kβ and Mn Kα observed by Si(Li) detector for a stainless steel sample was clearly resolved by PSS. The detection limit for Cr in a sample of K 2Cr 2O 7 was <200μg/g and detect limit for Ti in an aerosol sample could reach 10 -9 -10 -10 g order. These indicated that with further decrease of detection limit of PSS, the research of trace element analysis with high-energy resolution would be feasible by using PSS combined with the exciting source of μ-SRL beam.