摘要
该文用 XPS分析了 MCP电极表面以及 代像增强器 MCP电极表面成份。结果表明 , 代像增强器 MCP电极表面碱金属与铅的含量达 9.69%。这是 代增强器等效背景噪声的主要来源。用加热器控制了 代像增强器制备过程中的碱金属流场和碱金属蒸气对 MCP的污染 ,从而使 代像增强器信噪比达 5.0
Electrode surface compositions of MCP and the MCP of second generation image intensifiers are studied with XPS. The results show that one of the equivalent background noise sources in second generation image intensifiers comes from the impurities K, Na, Cs and Pb existing on the electrode surface of the MCP, and the impurity content attains 9.69%. Pollution of alkali metal can be controled by a heater that controls the flow field of alkali metal vapor when the photocathode is prepared. In this way a 5.06 signal/noise ratio for the second generation image intensifiers can be achieved.
出处
《兵工学报》
EI
CAS
CSCD
北大核心
2001年第2期199-200,共2页
Acta Armamentarii