摘要
本文提出了在模拟线性电路故障诊断中 K故障假设下一组最优可测试成份确定的方法 .它是基于电路的可测试值计算规范式不确定性组的确定 。
A method of determining an optimum set of testable components in the fault diagnosis of analog linear circuits under K faults hypothesis is presented in the paper.It is beaed on the testability evaluation of the circuit and on the determination of the canonical ambiguity group.The proposed procedure is independent on the method of fault location.
出处
《数学理论与应用》
2001年第2期116-120,共5页
Mathematical Theory and Applications
