多层系统周期样品PSTM消假像微扰近似

A perturbation approach of a multilayer system to the periodic sample for eliminating false image of PSTM

本文利用一级微扰近似方法对三层系统 (样品台 样品 空气 )表面周期起伏样品采用π 对称双激光束照射得到等强度和等高度扫描的数值模拟近场强度图像。通过与单激光束照射图像比较 ,作者看到双激光束照射下的一级微扰图像能够除去由样品表面起伏的微扰而产生的动量局域偏移 ,也可减小由表面倾角引起的假像。此三层系统起伏样品能够较真实地模拟实验 。

This paper is based on a perturbation approach by using two beams at 0 azimuth and π azimuth illuminating a periodic sample of a multilayer system to reduce false image in order to obtain the intensity maps in constant intensity and in constant height scanning mode respectively. By contrast, the author demonstrated that the local moment deviation that comes from the perturbation of rough sample will be eliminated on the near filed intensity image by using two beams illuminating.The multilayer system and rough sample are close to some realistic applications.