基于机内测试(BIT)的LCC模型改进

Improved LCC Model in Terms of Built-in Test

在分析原寿命周期费用 (LCC)模型的基础上 ,给出了一种将机内测试 (BIT)结合到电子系统LCC中的方法 ;推导了改进的LCC费用模型。该模型反映了采用BIT带来的益处 ,减少了维修时间、外部测试设备、备件等的需求量、以及对人员技术水平和预防性维修的要求。在改进的LCC模型中考虑了如下设计因素 :诊断差错、诊断不明、未检测故障、BIT硬件故障和虚警等。

Based on the analysis of the original LCC model,a method is given for incorporating the effects of built-in test (BIT) into the life cycle cost of a given electronic system An improved LCC model is given that captures the savings achieved by BIT through reducing the maintenance times,complexity of external test equipment,personnel skill levels,amount of spare parts,and the need for preventive maintenance The model also includes such design considerations as false alarms,diagnostic errors,undetected faults,BIT hardware failures,and diagnostic ambiguity