期刊文献+

表面微观形貌测量中数字图象处理的应用 被引量:3

APPLICATION OF DIGITAL IMAGE MANAGE IN MICRO-TOPOGRAPHY MEASURE
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摘要 应用相移干涉术测量物体表面微观形貌时 ,由于各种因素的影响 ,表面形貌的测量会产生失真的现象 .本文采用数字信号滤波与平滑技术消除了测量过程中系统误差引起的波纹度及系统噪音 ,去除了在图象的数字化和传输过程中产生的高频噪音和假轮廓 。 When applying phase stepping interferometry to measure testing surface,distortion will be caused as a result of various error factor.Digital signal filter and smoothness technique was applied in this paper,and flexuosity and system noise caused by system error in measure process were eliminated.The high frequency noise and artificial profile caused by image digital and transmite process were eliminated too.All of this made the measure results more approach actual numerical value.
出处 《光子学报》 EI CAS CSCD 北大核心 2001年第11期1372-1375,共4页 Acta Photonica Sinica
关键词 表面微观形貌 相移干涉术 数字图象处理 测量 数字信号滤波 平滑技术 Micro topography Phase stepping interferometry Digital image manage
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参考文献7

  • 1高宏,薛实,李庆祥,严普强.光学轮廓仪测量原理及其误差分析[J].清华大学学报(自然科学版),1992,32(2):42-48. 被引量:5
  • 2刘榴娣 刘明奇 等.实用数字图象处理[M].北京:北京理工大学出版社,1998.94-102.
  • 3Part Enander E,MATLAB 5 手册,2000年,149页
  • 4陈桂明,应用MATLAB语言处理数字信号与数字图像,2000年,225-233,246-261,262-271页
  • 5刘榴娣,实用数字图像处理,1998年,94页
  • 6胡广书,数字信号处理.理论、算法与实现,1997年,94页
  • 7赵宏,清华大学学报,1992年,32卷,2期,42页

二级参考文献4

共引文献4

同被引文献21

  • 1郭彤,胡春光,胡晓东,栗大超,金翠云,傅星,胡小唐.利用Mirau显微干涉仪测量微器件的纳米级运动[J].光子学报,2005,34(10):1542-1545. 被引量:8
  • 2张红霞,张以谟,井文才,李朝辉,周革,朱蔚.微表面形貌大视场检测相移显微干涉仪研制[J].光电子.激光,2006,17(8):934-936. 被引量:4
  • 3Hart M R, Conant R A, Lau K Y, et al. Stroboscopic interferometer system for dynamic MEMS characterization. J Microelectromech Syst, 2000,9 (4):409~418
  • 4Krehl P, Engemann S, Rembe C, et al. High-speed visualization, a powerful diagnostic tool for microactuators - retrospect and prospect. Microsystem Technologies, 1999,5(3): 113~132
  • 5Rembe C,Muller R S. Measurement system for full three dimensional motion characterization of MEMS. J Microelectromech Syst, 2002,11 (5): 479 ~ 488
  • 6Tang W C, Nguyen C H,Judy M W,et al. Eletrostaticcomb drive for lateral polysilicon resonators. Sensors & Actuators A,1990,21(2): 328~331
  • 7Davis C Q, Freeman D M. Using a light microscope to measure motions with nanometer accuracy. Opt Eng,1998,37(4): 1299~1304
  • 8Burdess J S, Harris A J,Wood D, et al. A system for dynamic characterization of microstructures. J Microelectroech Syst , 1997,6(4): 322~328
  • 9Burns D J, Helbig H F. A system for automatic electrical and optical characterization of microelectromechanical devices. J Microelectromech Syst, 1999,8(4) : 473~482
  • 10BINNIG G, ROHRER H. Scanning tunnel microscopy from birth to adolescence[R]. Nobel Lecture, 1986.

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