模拟原子探针垂直于晶界方向上的深度分析

Simulating of depth analysis of atomprobe along vertical direction to grain boundary

为了解决含垂直于轴向方向晶界的 FIM- AP试样的制备及 FIM- AP实验过程中操作的困难 ,获得沿垂直晶界方向上元素分布。本文应用数学模型和计算机技术 ,建立了一个以非垂直于晶界方向的原子探针 ( AP)深度分析实验结果为基础的垂直于晶界方向的元素分布的模型。并利用此模型对敏化 Fe- 1 7Cr合金晶界附近 Cr元素分布加以讨论。

In order to resolve the difficulties of the FIM AP sample preparation which contains a grain boundary along the vertical direction to axis and obtain the element distribution along the vertical directical boundary The article takes advantage of mathematical model and computer,the model of the element distribution along the vertical direction to grain boundary have been established,which according to non vertical direction to grain boundary,Using this model,The analysis for The chromium near the grain boundary sensitized Fe 17Cr alloy have been made.