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用DES理论测试数模混合电路 被引量:8

Testing Mixed-Signal Circuit With DES Theory
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摘要 针对数模混合电路测试时所遇到的难点 ,尝试寻找一个普遍通用的测试方法。由于数模混合电路具备DES的特点 ,文中采用近来发展的DES理论对数模混合电路进行可测性分析 ,讨论该类电路可测试的基本条件。针对电路检测时的不同要求和实际情况 ,研究了测试速度较快、测试成本较低的方法 ,且该法可用一定的算法在计算机上实现 ,最后用实例进行了方法验证。 The paper tries to find a common method aiming at the difficulties while testing mixed-signal circuits. Because mixed-signal circuits possess charades of the DES, the article analyses the testability of those circuits with DES theory which developed recently, and researches the basic terms of the circuit testability. According to the different request and exact conditions while the circuit is tested, the paper studies a faster and lower cost test method, which can be realized on computer through certain arithmetics. At last the article presents a example to illustrate the method.
作者 张巍 夏立
出处 《系统工程与电子技术》 EI CSCD 北大核心 2001年第10期19-21,共3页 Systems Engineering and Electronics
关键词 数模转换 集成电路 混合电路 离散分布 DES Digital-analog conversion Hybrid circuit Discrete distribution
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参考文献2

  • 1Feng Lin,Int J Circuit Theory Appl,1997年,25卷,81页
  • 2Feng Lin,Proceeding of 36th Midwest Symposium on Circuit and Systems IEEE,1993年,344页

同被引文献34

  • 1赵岩岭,刘春,曹源,高翠云,陈胜军.基于GASA的最小测试集求取的研究[J].仪器仪表学报,2004,25(z1):981-983. 被引量:1
  • 2蒋薇薇,鲁昌华,章其波,刘春.基于图论的最小测试集的寻找[J].仪器仪表学报,2003,24(z2):295-297. 被引量:4
  • 3[1]Linda S. Milor. A tutorial introduction to research on analog and mixed-signal circuit testing. IEEE Transcactions on Circuits and Systems. Analog and Digital Processing Ⅱ ,1998,45(10) :1389~1405.
  • 4[2]A. Salams, J. Starzyk, J. Bandler. A unified decomposition approach for fault location in large analog circuits.IEEE Trans. , 1983,25 : 6367 ~ 6368.
  • 5[3]M.A. A1-Qutayri, P. R. Shepherd. On the testing mixed-mode integrated circuits. Journal of Semicustom Ics, 1990,7(4) : 32~ 39.
  • 6[1]Feng Lin,Zhang Hui Lin,William Lin T. A uniform approach to mixed-Signal circuit test [J]. International Journal of Circuit Theory and Application, 1997,25 : 81~93.
  • 7[2]Feng Lin,William Lin T. Diagnosability of discrete event systems and its applications to circuit testing [C]. Proceeding of 36th Midwest Symposium on Circuit and Systems, IEEE, 1993: 344 ~ 347.
  • 8[4]Lin F T,Kao C Y,Hsu C C. Applying the genetic approach to simulated annealing in solving some NP-hard.IEEE Trans on SMC,1993,23(6):1752~1767.
  • 9[1]Feng Lin,Zheng Hui Lin,T.William Lin. A Uniform Approach to Mixed-Singal Circuit Test[J]. International Journal of Circuit Theory and Applications,1997,25:81~93.
  • 10[5]Feng Lin,Lin T W.Diagnoseability of Discrete event systems and it's applications to circuit testing[J]. Proceeding of 36th Midwest Symposium on Circuit and Systems, IEEE,1993:344~347.

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