摘要
采用微波等离子体化学气相沉积( MPCVD)法在附有 SiO2掩摸的硅衬底上选择性沉积出 了金刚石膜。采用扫描电子显微镜( SEM)和 Raman光谱仪对金刚石膜的表面形貌和结构进行 了表征 ,并讨论了衬底温度对金刚石薄膜选择性沉积的影响,得出了较佳的沉积条件。
In this paper the morphology and quality of diamond films selectively deposited by micro- wave plasma chemical vapor deposition (MPCVD) on SiO2 patterned Si substrates were investigated by scanning electron microscope (SEM) and Raman Spectrum. Results indicates that the diamond nucleation density on the SiO2 mask increases with the substrate temperature,so as to deteriorate the effect of selective deposition of diamond films. This change trend and the optimized deposition tem- perature were also discussed.
出处
《功能材料与器件学报》
CAS
CSCD
2001年第3期314-317,共4页
Journal of Functional Materials and Devices
关键词
金刚石膜
选择性生长
MPCVD
硅衬底
diamond films
selective area growth
chemical vapor deposition (CVD)