高密度基因芯片探针布局方法

Methods of arranging probes on high-density gene chip

为了提高基因芯片制备质量和检测的准确性 ,提出两种基因芯片布局方法 ,一是分子印章凸点优化布局方法 ,另一种是基于探针杂交解链温度的梯度场布局方法。利用上述两种方法对所设计的高密度基因芯片进行控针布局实验 ,结果表明 :第一种方法能够使制备基因芯片的分子印章上凸点均匀分布 ,解决误压印问题 ,从而提高基因芯片的制备质量 ;而第二种方法能够使基因芯片上的探针按照杂交解链温度有序地组织起来 。

Gene chip has an important application to gene expression analysis and gene polymorphism analysis. In order to improve the quality of gene chip fabrication and the accuracy of gene detection, two methods of arranging probes on a gene chip have been proposed. The first is based on protruding point optimization, while the second is based on the grads field of Tm, which is the melting temperature of a probe. By using the first method, the protruding points on molecular stamps can be uniformly distributed, and the problem of incorrectly printing can be resolved. By using the second method, probes on a gene chip can be arranged in order of their Tm, and single base mismatch discrimination can be allowed for that chip.