双管显微镜测量表面粗糙度评定参数的处理程序设计

Processing Procedure Design of Surface Roughness Parameter Evaluation by Dual-microscope

介绍了用双管显微镜测量轮廓线坐标值的方法 ,同时 ,设计了计算表面粗糙度六个评定参数的微机处理程序。从而 ,扩大了只用于测量单参数的表面粗糙度检查仪的使用功能 ,以满足表面粗糙度国家标准所规定的评定参数的要求。还给出了程序流程图。实验表明 。

Traditional dual microscope can only be used to measure single parameter of surface profile roughness. This paper presents a new method of using dual microscope to measure surface profile coordinate values and the processing procedure for calculating 6 roughness parameters.By this method, the function of the instrument is extended and can satisfy the requirement of the surface roughness national standard. The program flow chart is given. The experiments show that the new method has the advantages of high accuracy and speed.