摘要
就铜熔体来说 ,弧后残躯电阻是由几乎在相同的时间里增长的膨胀电阻和残躯斜形部分的电阻总和。研究了影响弧后残躯电阻的主要因素 ,以便确定出最佳工作状态 ,为优化设计提供可靠的依据。
The paper presented investigations in which was detected that post arc fulgurate resistance in the case of Cu element is a sum of nearly equally rising in time of swell resistance and resistance of wedge shaped parts of fulgurate. Furthermore the main influence factors in post arc fulgurate resistance were also studied, which was useful to give an optimal design of a fuse.
出处
《低压电器》
2001年第5期3-6,共4页
Low Voltage Apparatus
关键词
弧后残躯电阻
铜熔体
膨胀电阻
熔断器
post arc fulgurate resistance Cu element swell resistance resistance of wedge shaped parts of fulgurate
