摘要
对磁共振成像设备层厚测量技术进行研究。利用Magphan体模在13台设备上对层厚的三种测量方法即单一斜面方法、交叉斜面方法和本文提出的改进方法(考虑几何畸变的交叉斜面测量方法)进行层厚测量实验。实验结果表明(1)进行层厚测量时,应考虑影响层厚测量的因素,并选择合适的体模;(2)三种方法的测量结果存在一定差异,其中考虑几何畸变的交叉斜面测量方法是最好的方法,此方法得到结果最接近真实值。
The measurement technique of slice thickness of Magnetic resonance imaging(MRI)was studied.The Magphan phan-tom was used to test13sets of MRI.We use three methods to do the research,viz.single ramp method,two-crossed ramps method and the new method-two crossed ramps with considering spatial distortion.The results proved:(1)should consider the factors which affect the accuracy of measurement for the slice thickness and select appropriate phantom;(2)all results of three methods had some different.The method of two-crossed ramps with considering spatial distortion was the best method and could get the result which was most closed to real value.
出处
《中国医学物理学杂志》
CSCD
2001年第2期83-85,共3页
Chinese Journal of Medical Physics
关键词
磁共振成像
层厚
单一斜面
交叉斜面
几何畸变
magnetic resonance imaging
slice thickness
single ramp
two crossed ramps
spatial distortion
