摘要
红外焦平面阵列探测器广泛应用于红外成像制导系统。但焦平面阵列的非均匀性校正技术与探测器的性能息息相关 ,因此必须进行非均匀性校正。在众多非均匀校正方法中 ,两点法和时间高通自适应方法是两种最典型的方法。文中对这两种方法分别进行了分析 ,并对一般的时间高通自适应非均匀校正法提出了改进 。
Infrared focal plane array(IR FPA) detector has been widely used in new infrared guided system because of its outstanding performance But the Nonuniformity of IR FPA debases the perforance of the detector Lots of nonuniformity correction methods have been developed to solve the problem The paper puts forward a modified method to correct the nonuniformity of IRFPA to get better infrared image
出处
《国防科技大学学报》
EI
CAS
CSCD
北大核心
2001年第5期122-125,共4页
Journal of National University of Defense Technology
关键词
红外探测器
焦平面阵列
两点法
非均匀校正
时间高通法
红外制导
Infrared Detector
Focal Plane Array
Two Point Method
Nonuniformity Correction
Temporal High Pass Method
