氩气氛下制备的C_(60)薄膜的形貌、结构和光学性质

Morphological,Structural and Optical Properties of C_(60) Films Grown in Argon Atmosphere

用原子力显微镜 (AFM)、X射线衍射 (XRD)、红外光谱 (IR)及紫外 可见光谱 (UV/VIS)研究了在氩 (Ar)气氛下制备的C60 薄膜的表面形貌、结构及光吸收特性。发现其UV/VIS的强度和吸收峰位置明显不同于在真空中制备的C60 薄膜。与真空中制备的C60 薄膜比较 ,所研究薄膜的红外谱没有变化 ,但X射线衍射表明其结构从面心立方 (fcc)相变成fcc相与六角密堆(hcp)相的混合相。AFM表明 ,在Ar气氛中制备的C60 薄膜有较大的表面粒子 ,并且表面生长岛更尖锐。这将有利于C60 薄膜的场电子发射。

Surface morphology,microstructures and optical properties of the C 60 films,grown in argon atmosphere by thermal evaporation,were studied with atomic force microscopy (AFM),X-ray diffraction (XRD),infrared spectroscopy (IR) and ultraviolet-visible optical absorption spectroscopy (UV/VIS),respectively.The UV/VIS spectrum of the film markedly differs from that of the C 60 film grown in vacuum.While no chemical change was found in IR analysis,a mixture of face-centered cubic and hexagonal close-packed phases can be observed in XRD spectra.AFM images of the C 60 films grown in Ar atmosphere reveal that as compared to the films grown in vacuum,the cone-shaped grains on surfaces are fairly larger,with sharp ending pointing upward.We suggest that these grains be used as field emitters.