PIN管结电容的代换测量与回归分析

Substitution Measurement of Junction Capacitance of PIN Photodiode and Regression Analysis

本文通过一组标准电容的代换测量 ,建立了测量电压与电容量的函数关系 ,并采用插值和回归分析得到结电容与偏压的特性曲线 ,该方法有效地克服了杂散电容及电路噪声对测量精度的影响 。

In this paper, the function relationship has been built up through substitution measurement of a series of standard capacitors and the characteristic curve between capacitance and bias voltage has been achieved using interpolation and regression analysis. This method effectively overcomes effects of stray capacitance and circuit noise. Measurement errors are determined mainly by the accuracy of standard capacitance.