基于ATPG的可测性设计在RSIC CPU的应用

DFT based on ATPG is utilized to RSIC CPU

介绍了自动测试模式生成的测试故障模型和设计流程，以及自动测试模式生成结合可测性设计技术在测试ＲＳＩＣ

This paper introduces fault model and design flow of the ATPG (automatic test pattern generation) techniques, which are utilized to test RSIC CPU manufacturing defects along with DFT(design for test) technology.