摘要
从等离子体的强化状态、影响强化状态的分析参数及易电离元素对进样系统的影响三方面综述了电感耦合等离子体 光发射光谱分析中抑制易电离元素干扰的研究进展 ,引用文献 4
A review on the progress of the study on the depression of interferences of easily ionized elements in ICP OES is given in this paper, pertaining especially to the robust condition of ICP, analytical parameters affecting the robust condition and the effect of EIE on the injection sampling system (46 references are cited).
出处
《理化检验（化学分册）》
CAS
CSCD
北大核心
2001年第10期478-482,共5页
Physical Testing and Chemical Analysis(Part B:Chemical Analysis)
