面向系统芯片的可测性设计

SOC-Oriented Design for Testability

随着集成电路的规模不断增大 ,芯片的可测性设计正变得越来越重要。回顾了一些常用的可测性设计技术 ,分别讨论了系统芯片 ( SOC)

With the increase of the scale of integrated circuits, design for testability of IC's is becoming more and more important General design for testability techniques are reviewed in the paper, and strategies for testability design of blocks and chips in SOC design are discussed, respectively