摘要
本文描述了X光底片在位相对标定技术。其原理是使X射线谱经阶梯形吸收滤片透射后,对X光底片曝光,测量底片的曝光量。文中给出了标定方法和数据处理方法,而且也给出了在X光激光实验中得到的Kodak AA5底片的特性曲线。
An in-situ relative calibration technique for X-ray film is described in this paper. The technique is based on film exposure measurements which is irradiated by x-rays transmitted through a stepwedge absorption filter. The calibration method and the treatment method of data are given. Also, we present a characteristic curve for Kodak AA5 film obtained in an X-ray laser experiment.
出处
《强激光与粒子束》
EI
CAS
CSCD
1991年第1期121-125,共5页
High Power Laser and Particle Beams
关键词
X光底片
在位相对标定
in-situ relative calibration, stepwedge filter.
