摘要
利用Henke X光源,通过电子激发方式,获得了C的K_a线(277eV)和Mo的L线(193eV),通过X光激发方式,获得了Al的K_a线(1.5keV)和Ti的K_a线(4.5keV)。利用流气式正比计数管监测X射线强度,测得了Kodak SWR底片对以上四种能量的X光的响应曲线。
On a Henke X-ray source we produced Ka line of C (277eV) and L line of Mo, and Ka line of Al (l.5keV) and Ka line of Ti (4.5keV) by X-ray excition. The X-ray intensities were monitored by proportional counters, we obtained sensitivity curves of Kodak SWR X-ray film for these different energy X rays.
出处
《强激光与粒子束》
EI
CAS
CSCD
1991年第4期493-497,共5页
High Power Laser and Particle Beams
关键词
底片
响应曲线
激光
等离子体
诊断
sensitivity curve of film. Henke X-ray source, proportional counter, characteris-tic X-ray spectra.
