PZT/YBCO异质结电容在超导临界温区反常跳变的机理研究

Studies of PZT/YBCO Heterostructures Capacitance Abnormal Jump at YBa_2Cu_3O_(7-δ) Superconductor Transform Temperature

运用 HP4 2 84 A通过对不同质量样品的实验研究比较 ,对PZT/ YBCO异质结电容值在超导临界温区的跳变行为进行了系统的研究 .以一个物理参数等效电路模型 ,揭示了 PZT/ YBCO异质结电容值在超导临界温区跳变行为的起因 ,给出了薄膜的漏电阻 。

A systematic experimental study is presented on the capacitance abnormal jump of the PZT/YBCO heterostructures at YBCO superconductor critical temperature by using the HP4284A precise LCR meter.A simple equivalent physical parameters model is proposed to reveal the reason for the abnormal capacitance jump of the PZT/YBCO heterostructures at the superconductor critical temperature.It has been shown that this abnormal jump is manily determined by the leakage resistance of PZT film,the change of the YBCO electrode resistance at the critical temperature and the frequency used for capacitance measuring.