脉冲激光辐照CCD面阵探测器系统局部的干扰效应研究

Study of Disturb Effect to Array CCD Detectors Irradiated Locally by Pulse Laser

采用脉冲激光对面阵 CCD探测器系统进行干扰 ,研究了脉冲激光辐照 CCD系统局部时 ,系统工作状态的变化 ,测量了 CCD探测器系统的饱和阈值范围 ,分析了饱和的原因。在实验中观察到“光饱和串音”现象 ,实验验证了不同干扰频率对

It is different that CCD detector or CCD detector system irradiated by pulse laser. When the CCD detector system irradiated locally by different frequency pulse laser,the state of detector system is variable. The saturation threshold of CCD detector system is measured and the saturation reason is discussed. The different disturb effect is achieved in experiment.