摘要
对卢瑟福背散射分析的基本原理作了概要的介绍。论述了背散射分析的最佳实验条件、质量分辨率和分析灵敏度。
The essential principle of Rutherford backscattering analysis is explained briefly. The optimization condition of experiments, mass resolution and the sensitivity of backscattering analysis are discussed. Some applications of Rutherford backscattering analysis to the study on the surface layer of materials and on thin films are given.
出处
《理化检验（物理分册）》
CAS
2002年第1期41-46,共6页
Physical Testing and Chemical Analysis(Part A:Physical Testing)
