用类He离子谱线强度比测量激光产生等离子体电子温度和密度

MEASUREMENTS OF DENSITY AND TEMPERATURE OF LASER-PRODUCED PLASMA BASED ON HELIUM-LIKE ION SPECTRA

一、引言在X光激光(XRL)和惯性约束聚变(ICF)研究中,等离子体电子温度和密度是表征等离子体状态的重要参数之一。虽然等离子体辐射各谱线强度与发射源的温度,密度和离子丰度直接相关,但要得到各谱线的绝对强度是很困难的,因为用于测量谱线强度探测器的绝对刻度相当困难。早在70年代初,苏联Aglitskii等首次用类He离子谱线强度比测量等离子体电子温度和密度。

The measurement of density and temperature of a laser-produced plasma through relative intensity ratios of helium-like ion spectra is described. The X-ray spectrum is recorded on kodak AA5 films with a flat-crystal spectrograph. Based on film exposure measurments of an X-ray spectrum transmitted through a step-wedge absorption filter, characteristic curves for kodak AA5 film were obtained.