在氩气氛下生长的C_(60)薄膜的结构与特性

Structure and Characteristics of C_(60) Thin Films Grown in Argon Atmosphere

采用惰性气氛蒸发法制备 C6 0 薄膜 ,用原子力显微镜 (AFM)、X射线衍射 (XRD)、红外光谱 (IR)及紫外 -可见光谱研究了在氩 (Ar)气氛下生长的 C6 0 薄膜的表面形貌、结构及光吸收特性 .AFM测量表明在 Ar气氛下生长的C6 0 薄膜的表面生长岛更尖锐 ,并且有较大直径的表面粒子 .由紫外 -可见光吸收谱测量发现 Ar气氛下生长的 C6 0 薄膜的强度和吸收峰位置与在真空下生长的 C6 0 薄膜比较有大的红移 .可求出在 Ar气氛下生长的 C6 0 薄膜的光学禁带宽度 Eg=2 .2 4e V,比在真空下生长的 C6 0 薄膜禁带宽度 (2 .0 2 e V)要大 .与真空下生长的 C6 0 薄膜比较 ,Ar气氛下生长的 C6 0 薄膜的红外谱没有变化 ,但 X射线衍射表明其结构从面心立方 (fcc)相变成 fcc相与六角密堆 (hcp)

The surface morphology,structure and optical absorption characteristics of C 60 thin films grown in an argon atmosphere by thermal evaporation are studied by using atomic force microscope,X ray diffraction,infrared spectroscopy and ultraviolet visible optical absorption spectrum.It has been found under an atomic force microscope,the surface particles on C 60 thin films grown in an argon atmosphere are larger and sharper than those in vacuum.Ultraviolet visible optical absorption spectrum for the former,with the wavelength ranging from 200nm to 600nm,is different from that for the latter .The optical bandgap E g is 2 24eV for C 60 thin films grown in argon atmosphere,which is larger than that for C 60 thin films grown in vacuum .IR analysis shows no change observed in a vibrational mode,while XRD reveals a mixture of the face centred cubic and hexagonal close packed phases.