晶体的半波电压消光比测试及微机管理系统

Blend the Semiware Voltage of the Crystal and Test Hatio of Dulling-rag and the Microcomputer Management System

本文介绍了用在电光快门的调制晶体的有关参数，如半波电压、消光比的 测试系统，以及利用实验室现有条件对此系统进行微机管理的软硬件结构。

This paper introduces concerned parameters used in electro-optic shutter to blend the crystal, such as the semiware voltage , the test system of the ratio of dulling-rag and the structure of harel software to carry out the microcomputer management on this laboratory system making use of the conditions that the lab existed.