小鼠局灶性脑损伤下丘脑室旁核神经元c-fos基因表达的机制及其意义

The mechanism and meaning of c-fos gene expression in mouse paraventricular nucleus induced by focal brain injury

目的 探讨脑损伤后应激状态下室旁核 (paraventricularnucleus,PVN)神经元中c -fos基因的表达机制及其意义。 方法 成年雄性昆明小白鼠 2 8只 ,随机分为 7组 ,1组为正常对照组 ,其余 6组为致伤组。以小鼠局灶性脑损伤模型为研究对象 ,采用原位杂交法对脑损伤后不同时间PVN神经元中c -fos基因表达状况进行检测。 结果 脑损伤后 5min ,小鼠双侧PVN中有散在分布的c -fos阳性细胞 ;损伤后 15min ,c-fos阳性细胞呈低密度 ,较同期皮层神经元中密度要高 ,30min时达到最高密度 ,而后回到基线水平 ;损伤后 2 4h仍有低密度表达。 结论 脑损伤后机体处于应激状态 ,可以通过不同于皮层神经元的其他途径诱发PVN中c

Objective To study the features of c fos expression in paraventricular nucleus after brain injury. Methods Using mice focal brain injury model we detected the c fos expression in paraventricular nucleus by situ hybridization. Results c fos positive cells can be found in both sides of the mouse PVN (paraventricular nucleus) 5 minutes after brain injury. Fifteen minutes after brain injury, the density of c fos positive cells was low, but it was higher than that of cortex neurons in the corresponding period. The density of c fos positive cells was highest 30 minutes after brain injury. Thereafter, the density recurred to the base line level. There was still low expression 24 hours after brain injury. Conclusions Organism is in stress after brain injury, which can induce c fos expression in PVN through a path different from that of cortex neuron.