摘要
采用 OM、SEM、XRD、DTA、EPMA等手段 ,系统研究了瓷绝缘子棕红釉面黑色网状缺陷的工艺及结构特征 ,探讨了缺陷形成的机理。结果表明 ,这种缺陷产生的主要原因是由于使用了氧化物着色及原料配比、釉浆性能、施釉厚度、烧成温度、烧成气氛控制不当所致。
It was studied on the black network deficiency in the electric porcelain′s brown red glaze in technology and structure by means of OM,SEM,XRD,DTA,EPMA etc.The deficiency′s forming mechanism is studied as well.The result indicates that the deficiency is referred to improper use of the oxide colourant and material composition, the control of glaze property, glaze thickness,the firing temperature and the firing atmosphere control.
出处
《电瓷避雷器》
CAS
北大核心
2001年第5期3-8,共6页
Insulators and Surge Arresters
关键词
复合尖晶石
结晶分相
黑色网状结构
瓷绝缘子
棕红釉
insulator
complex spinel
crystallization and phase separation
black network structure