摘要
本文分析了影响V/I法高阻测量精度的主要因素,设计了以单片机为核心的高阻测量仪。采用加压测流的方案,运用双屏蔽输入电缆、优选输入级器件、隔离等关键技术,使电阻测量可达10^(16)Ω,电流测量可达10^(-13)A。
This paper analyzes the main factor of affecting the measurement in high resistance measurement with V/I method, designs a high resistance measurement instrument based on microprocessor control. It uses some key technologies such as measuring resistance with V/I method, adopts two layers shielded input cable, selects proper input elements, analog circuit is isolated with digital circuit, etc. It measures the resistance as high as 10 16 and measures the current as weak as 10-13A.
出处
《国外电子测量技术》
2001年第3期6-7,17,共3页
Foreign Electronic Measurement Technology
