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低温离子渗硫层相结构的研究 被引量:4

Study on Phase Structure in Low-temperature Ion Sulphurized Layer
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摘要 采用X射线光电子能谱 (XPS)对低温离子渗硫层的相结构进行了研究。结果表明 ,炉气中的氧是渗硫层中存在FeSO4 和FeSO3 的主要因素。用CS2 蒸气作渗硫气源可避免在渗硫层中出现FeSO4 和FeSO3 ,渗硫层中FeS和FeS2 的相对量与炉气压力有关。在最佳工艺参数条件下 。 Phase structure of low temperature ion sulphurized layer was tested by means of XPS.The results show that oxygen in furnace atmosphere is main factor which existing FeSO 4 and FeSO 3 in sulphurized layer.The FeSO 4 and FeSO 3 could be avoided by use CS 2 vapour.The amount ratio of FeS and FeS 2 in sulphurized layer is related to pressure of furnace atmosphere.Under the condition of optimum technological parameters the single FeS layer can be obtained.
出处 《金属热处理》 CAS CSCD 北大核心 2002年第2期9-12,共4页 Heat Treatment of Metals
关键词 离子渗硫 相结合 X射线光电子能谱 低温 ion suphurizing phase structure X ray photo electron spectrometry(XPS)
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