摘要
采用现场可编程门阵列 (FPGA)和PCI 90 5 2目标接口芯片 ,实现了符合PCI总线规范和IEEE 114 9 1标准的超大规模集成电路边界扫描测试系统 ,具有对系统级、PCB级和芯片级集成电路进行边界扫描测试的功能 ,结构简单、速度快。
A VLSI boundary-scan test system constructed by using FPGA FLEX10k30A and PCI 9052 target interface chip is presented. This system functions boundary scan test for system, PCB, chip level integrated circuit, complies with PCI bus regulation and IEEE 1149 1 standard and is characterized by concise structure, high-speed and reliability.
出处
《计算机测量与控制》
CSCD
2002年第2期76-77,80,共3页
Computer Measurement &Control
基金
总装备部基金项目 (EP990 114 )
