摘要
文章介绍一种已研制出的小型微机半导体高频C—V测试仪,分析了测试系统和它的工作原理。简要地指出程序设计流程和所用公式。实验证明该仪器有使用方便、迅速、价格低廉等特点。
A small microcomputer semiconductor high frequency G-V test equipment is described in this paper. The measurement system and its principle are analysed Brief explanation of the program design and formula are presented. The experiment ahopwed that the equipment, is easy to use. time saving and low cost.
出处
《沈阳工业大学学报》
EI
CAS
1991年第4期45-49,共5页
Journal of Shenyang University of Technology
关键词
半导体器件
测试装置
微机
microcomputer
semiconductor deviee
testing equipment
capacitance-voltage characteristic
