摘要
处在H2 气氛围下的氧化铝陶瓷受电子辐照时表面电导率会发生变化 ,这在某些应用中是非常重要的。本文采用X射线光电子谱仪对阳极氧化法制备的氧化铝薄膜 (厚度 6 0nm)作了模拟研究。结果表明 ,原制备的样品存在有氧化铝和氢氧化铝 2种化学状态 ,然而 ,经H2 气氛围下荷能电子 (5keV)辐照后 ,部分氢氧化铝态转变为氧化铝态。同时 ,样品表面的C污染将降低约 1个数量级。经上述处理后 。
The changes,for example in electrical conductivity,of aluminum oxide ceramic under electron irradiation in hydrogen atmosphere are important in some cases.In this work,the chemical states of the aluminum oxide prepared by anodizing process with thickness of 60 nm has been investigated with X ray photoelectron spectroscopy(XPS).The results show that there are two kinds of states,aluminum oxide and aluminum hydroxide in the original sample as prepared,and the aluminum hydroxide component turns partially into the aluminum oxide state under the energetic electron(5 keV)irradiation in the hydrogen environment.Also the carbon contamination on the sample surface will be greatly reduced by one order of magnitude.We conclude that the insulativity will not be degraded during the treatment mentioned above.
出处
《真空科学与技术》
CSCD
北大核心
2001年第5期398-400,共3页
Vacuum Science and Technology
基金
中国工程物理研究院科学技术基金资助项目 (990 5 0 2 2 9)