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成像光谱仪分光技术概览 被引量:55

Overview of Spectrum-Dividing Technologies in Imaging Spectrometers
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摘要 论文介绍了多种成像光谱仪的分光技术。棱镜或光栅色散型成像光谱仪技术成熟 ,应用广泛 ;在发散光束中使用光栅的方法 ,克服了准直光束用法中的一些缺陷 ;傅里叶变换光谱仪是遥感探测可见和红外弱辐射的有力工具 ;光楔成像光谱仪结构简单 ,随着渐变滤光片工艺技术的成熟 ,已走向实用化 ;采用可调谐滤光片的成像光谱仪由于滤光片水平的限制 ,投入应用还有待时日 ;采用二元光学元件的成像光谱仪结构紧凑 ,体积小 ,扫描速度快 ,已研制出地面实用型产品 ;层析成像光谱仪原理新 ,目前还处在实验阶段 ;三维成像光谱仪可以同时获取二维影像和一维光谱信息 ,可实现对迅变目标的观测。 The paper describes several kinds of spectrum dividing techniques used in imaging spectrometers (IS). Dispersion type imaging spectrometers with a prism or grating have come to maturity, and used widely. The IS using a grating in divergent light is a new application method of the grating, which overcomes the defects of IS using a grating in collimated light. The imaging Fourier transform spectrometers (IFTS) have been a powerful tool to remotely detect visible and weak IR radiation. Wedge imaging spectrometer (WIS) has simple construction, and begins to be applied in practice with the further maturity of the process of variable filter. Owing to the limitation of the tunable filter manufacturing process, the imaging spectrometer using tunable filters will need long time to be used as payloads of satellites. The imaging spectrometer using diffractive optics has compact construction, small volume and rapid scanning speed, and its practical ground manufacture have been visible. The computed tomography imaging spectrometer (CTIS) is in the experimental stage because of its new working principle. 3D imaging spectrometer can be used to measure the objects which often change rapidly, by use of its unique characteristics it can obtain two dimension image and one dimension spectral information.
出处 《遥感学报》 EI CSCD 北大核心 2002年第1期75-80,共6页 NATIONAL REMOTE SENSING BULLETIN
关键词 成像光谱仪 分光技术 傅里叶变换光谱仪 可调谐滤光片 二元光学元件 层析 三维成像光谱仪 遥感 imaging spectrometer spectrum dividing techniques Imaging Fourier Transform Imaging Spectrometer (IFTS) tunable filter diffractive optics Computed Tomography (CT) 3D Imaging Spectrometer
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二级参考文献2

  • 1徐介平,声光器件的原理、设计和应用,1992年
  • 2Chang I C,IEEE J Quant Electron,1988年,14卷,2期,108页

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