聚四氟乙烯多孔薄膜驻极体的电荷储存稳定性

The charge storage stability of porous polytetrafluoroethy lene film electret

利用在室温和高温下的栅控恒压电晕充电 ,常温电晕充电后经不同温度老化处理后的表面电位衰减测量 ,及开路热刺激放电 (ThermallyStimulatedDischarge ,TSD)研究了正负充电后PTFE(Polytetrafluoroethylene)多孔薄膜驻极体的电荷储存稳定性 .PTFE多孔膜 ,PTFE非多孔膜 (TeflonPTFE)和FEP(Tetrafluoroethylene hexa fluoropropyleneCopoly mer)非多孔膜 (TeflonFEP)间的电荷储存稳定性的比较研究也已进行 .通过等温退极化程序 ,对上述三种薄膜驻极体的电荷储存寿命 (有效时间常数 )τ进行了定量估算 .结果指出 :在有机驻极体材料中 ,对正负充电后两种极性驻极体样品的PTFE多孔薄膜驻极体均呈现最优异的电荷储存稳定性 ,尤其是在高温条件下 .通过扫描电镜 (SEM)对这种新结构的氟聚合物驻极体材料的突出电荷储存能力和结构根源也已初步讨论 .

The excellent charge storage stability both for negatively and positively corona charged porous polytetrafluoroethylene (PTFE) was studied by the isothermal surface potential decay measurements after constant voltage corona charging at room and elevated temperatures,the corona charging at room temperature and then aged at different temperatures,as well as open-circuit Thermally Stimulated Discharge (TSD) experiments.The comparison of the charge storage stability was investigated among porous PTFE, non-porous PTFE(Teflon PTFE) and non-porous FEP (Teflon FEP) electrets.Their charge lifetimes (effective time constant) τ were estimated by means of isothermal depolarization program.The results show that porous PTFE has the best charge storage stability both for negatively and positively charged samples in organic electret materials,especially at high temperatures.The structure source of the excellent charge storage stability for the porous film electret was investigated by the scanning electron microscope.