改善ADC微分非线性的一种方法

An improvement in differential non-linearity of analog-digital conversion

根据放射性能谱测量的误差并不等于对单个脉冲测量的误差的特点 ,提出一种先测出模数变换器的道宽 ,然后利用软件方法进行道宽均匀的技术。利用这种可在不附加道宽均匀电路的情况下将已商品化的高速高分辨率单片模数变换集成电路用于能谱测量。这种方法也可校正由前置放大器、线性放大器、成形电路、峰展宽电路和模数变换电路等共同造成的微分非线性和积分非线性。最后 ,给出了这种方法的计算机模拟仿真的一些结果。

Based on the difference of measuring errors between spectrum and a single pulse, the article intruduces a procedure which can improve the specification of non linearity of commercial ADC for spectrum measurement without channel width everaging circuit. First, the widths of channels of ADC are determined, then a software technique is used to correct the width of each of the channels. The improvement can also be used to correct total differencial and integral errors caused by pre amplifier, linear amplifier, shaping circuit, peak stretcher and holder as well as ADC at the same time. The results of a computer emulation of the technique are also presented.