摘要
阐述了在跌落冲击试验时主冲击与次冲击的特点 ;计算了产品模型对一个单次冲击循环的响应 ,分析了产品损坏的原因。当产品进行精密冲击试验时 ,消除次冲击是很有必要的。
This paper described the characteristics of major shock and secondary shocks in drop-test.It calculated the product system response on a shock course and analysed the reason of product damaging.When product conducts accurate shock testing,it is very necessary to eliminate the secondary shocks.
出处
《电子工业专用设备》
2001年第2期27-33,共7页
Equipment for Electronic Products Manufacturing
