2ROOKS S M, BENHABIB B. Development of an Inspection Process for Ball - Grid - Array Technology Using Scanned - Beam X - Ray Laminography [ J ]. IEEE TRANSACTIONS ON COMPONENTS, PACKAGING, AND MANUFACTURING TECHNOLOGY - PART A, 1995,18(4) :851 -861.
3TETSUHIRO S, TOSHINORI M, YOSHIHA A, et al. Development of Image Analysis for Detection of Defects of BGA by Using X - Ray Images [ C ]//IMTC 2003 - Instrumentation and Measurement Technology Conference Vail, CO. USA : [ s. n. ], 2003 : 20 - 22.
