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用于VLSI的MOSiC器件电特性模拟

MOSiC Electric Character Simulation for VLSI
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摘要 在分析了金属 -氧化物 -SiC (MOSiC)器件物理模型的基础上 ,分析了界面等物理效应对器件的影响 ,建立了适于VLSI的MOSiC器件模型。利用当今流行的MATLAB软件 ,模拟了MOSiC器件的电特性。 With the character dimension decreasing, some new physical effects appear, for example:surface, interface. Physical Models need rebuilding for VLSI. In this paper, we discuss how these physical effects work on the device after analyzing an old device model of Metal-Oxidation-SiC (MOSiC) and a new MOSiC device model is built for VLSI. The electric character of MOSiC device is simulated by using MATLAB software.
出处 《湘潭师范学院学报(自然科学版)》 2002年第1期26-29,共4页 Journal of Xiangtan Normal University (Natural Science Edition)
基金 湖北省自然科学基金 (2 0 0 0J15 8)
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参考文献4

  • 1J W Palmour, J A Edmond, H S Kong, et al. Amorphous and Crystalline Silicon Carbide IV[M].Berlin: Springer Verlag,1992.
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